• DocumentCode
    636144
  • Title

    Thin film capacitor for void fraction measurement in a two-phase system

  • Author

    Pranav, B. ; Kumar, B. Avinash ; Vetrichelvan, T. ; Raj, P. Deepak ; Venkatesan, M. ; Sridharan, M.

  • Author_Institution
    Sch. of Mech. Eng., SASTRA Univ., Thanjavur, India
  • fYear
    2013
  • fDate
    24-26 July 2013
  • Firstpage
    554
  • Lastpage
    556
  • Abstract
    This paper describes a two phase flow sensor using copper (Cu) thin film electrodes. A two phase flow constitutes a simultaneous flow of two different phases. To identify these phases in an air-water flow in a small diameter tube, Cu films were coated on to glass substrate at various substrate temperatures using dc magnetron sputtering technique. The films were characterized for their structural, morphological and electrical properties using X-ray diffraction (XRD), field-emission scanning electron microscope (FE-SEM) and resistance/capacitance measurement by LCR-Z meter. The grain size of the films increased with increase in the substrate temperature, which in turn reduced the defects. Due to this the resistance of the films decreased. The fabricated capacitor using the Cu film, exhibited different capacitance values with respect to the flow of fluid in the capillary tube.
  • Keywords
    X-ray diffraction; capillarity; copper; electrical resistivity; field emission ion microscopy; flow measurement; flow sensors; glass; pipe flow; scanning electron microscopy; sputter deposition; thin film capacitors; thin film sensors; two-phase flow; Cu; Cu film; FE-SEM; LCR-Z meter; X-ray diffraction; air-water flow; capacitance value; capillary tube; copper thin film electrode; dc magnetron sputtering technique; electrical property; field-emission scanning electron microscope; film grain size; film resistance; fluid flow; glass substrate; morphological property; resistance/capacitance measurement; simultaneous flow; small diameter tube; structural property; substrate temperature; thin film capacitor; two phase flow sensor; two-phase system; void fraction measurement; Films; Magnetic analysis; Phase measurement; Three-dimensional displays; Capacitors; Cu Films; DC Magnetron Sputtering; Two - phase flow;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Nanomaterials and Emerging Engineering Technologies (ICANMEET), 2013 International Conference on
  • Conference_Location
    Chennai
  • Print_ISBN
    978-1-4799-1377-0
  • Type

    conf

  • DOI
    10.1109/ICANMEET.2013.6609362
  • Filename
    6609362