DocumentCode :
637484
Title :
Sift-based image alignment for contactless palmprint verification
Author :
Qiushi Zhao ; Wei Bu ; Xiangqian Wu
Author_Institution :
Sch. of Comput. Sci. & Technol., Harbin Inst. of Technol. Harbin, Harbin, China
fYear :
2013
fDate :
4-7 June 2013
Firstpage :
1
Lastpage :
6
Abstract :
Contactless palmprint recognition is an effective way to improve the user-friendliness of palmprint recognition technology. The main challenge of contactless palmprint recognition is the intra-class variations caused by contact-less image acquisition. In such occasions, traditional palm-print recognition algorithms which require precise image alignment may not contribute. Aiming at solving this problem, this paper proposes a contactless palmprint recognition method with a precise palmprint image alignment. The original contactless palmprint images are firstly aligned using a projective transformation model that estimated from matched SIFT feature points. From the aligned images, a prominent palmprint feature representation method, the competitive code, is extracted and matched. Finally, matching scores of both SIFT and competitive code are fused to further improve the accuracy. Experiments on a public contactless palmprint database show that after the image alignment, the verification accuracy of competitive code has increased dramatically, and the result is further enhanced by fusing the matching scores of competitive code and SIFT features.
Keywords :
feature extraction; image fusion; image matching; image representation; palmprint recognition; transforms; visual databases; SIFT-based image alignment; competitive code extraction; competitive code matching; contactless image acquisition; contactless palmprint recognition method; contactless palmprint verification; intra-class variations; matched SIFT feature points; matching score fusion; palmprint feature representation method; projective transformation model; public contactless palmprint database; user-friendliness improvement; verification accuracy; Accuracy; Databases; Educational institutions; Feature extraction; Gabor filters; Image recognition; Imaging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Biometrics (ICB), 2013 International Conference on
Conference_Location :
Madrid
Type :
conf
DOI :
10.1109/ICB.2013.6612989
Filename :
6612989
Link To Document :
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