Title :
Hybrid Effect of Crossed Alignment and Multi-Stacking Structure on the Percolation Behavior of Silver Nanowire Networks
Author :
Bo-Ru Yang ; Gui-Shi Liu ; Song-Jia Han ; Wu Cao ; Hui-Jiuan Chen ; Jian-Gang Lu ; Shieh, Han-Ping D.
Author_Institution :
Sch. of Phys. & Eng., Sun Yat-Sen Univ., Guangzhou, China
Abstract :
Owing to the superiority of being flexible, highly conductive, and extremely transparent, silver nanowire (AgNW) has been regarded as a possible candidate to replace indium-tin-oxide (ITO) for flexible transparent conductive films (TCFs), flexible electronics, and flexible display applications. To make TCFs with lower sheet resistance ( Rs), but without sacrificing the optical transmittance, the deployment of AgNWs is very critical. A crossed-alignment method along with multi-stacking structure was proposed to lower the percolative threshold, which thus can decrease the R s by a factor of more than two, in the premise of not affecting the optical transmittance.
Keywords :
conducting materials; flexible displays; nanowires; percolation; silver; Ag; AgNW; ITO; TCF; crossed-alignment method; flexible display application; flexible electronics; flexible transparent conductive film; indium-tin-oxide; multistacking structure; optical transmittance; percolative threshold behavior; sheet resistance; silver nanowire network; Coatings; Optical device fabrication; Optical films; Optical sensors; Resistance; Silver; Flexible electronics and displays; silver nanowires (AgNWs); transparent conductive film (TCF);
Journal_Title :
Display Technology, Journal of
DOI :
10.1109/JDT.2015.2432836