DocumentCode :
638224
Title :
Performance evaluation of filters at X band frequency
Author :
Sekhar, P.C. ; Rao, T. Naga Venkata Chandra Sekhara ; Gopal, Y. Raj ; Palini, P. ; Jha, R.
fYear :
2013
fDate :
26-28 July 2013
Firstpage :
1
Lastpage :
5
Abstract :
The response of scattering parameters for various filters at microwave frequency range is presented in this paper. Although applicable at any frequency, S-parameters are mostly used for networks operating at radio frequencies (RF) where signal power and energy considerations are more easily quantified than currents and voltages. The basic idea consists of considering the filter as a two port network, then the open circuit and closed circuit responses of the filter can be derived by using the Impedance parameters. The scattering parameters are obtained by using the Impedance parameters. Insertion loss, return loss, voltage standing wave ratio (VSWR) for different filters in terms of S-parameters have been plotted at X-band frequency. Return loss is a measure of how well devices or lines are matched. A match is good if the return loss is high. A high return loss is desirable and results in a lower insertion loss. This paper which in turns provides most efficient filters used at radar receivers.
Keywords :
S-parameters; microwave filters; radar receivers; two-port networks; X band frequency; closed circuit; energy considerations; impedance parameters; insertion loss; microwave filter; microwave frequency range; open circuit; performance evaluation; radar receivers; radio frequencies; return loss; scattering parameters; signal power; two port network; voltage standing wave ratio; Band-pass filters; Insertion loss; Microwave circuits; Microwave filters; Ports (Computers); Radio frequency; Scattering parameters; S-parameters; insertion loss; return loss; voltage standing wave ratio etc;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Wireless and Optical Communications Networks (WOCN), 2013 Tenth International Conference on
Conference_Location :
Bhopal
ISSN :
2151-7681
Print_ISBN :
978-1-4673-5997-9
Type :
conf
DOI :
10.1109/WOCN.2013.6616184
Filename :
6616184
Link To Document :
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