• DocumentCode
    638281
  • Title

    The Time/State-based Software-Intensive Systems Failure Mode Researches

  • Author

    Xuan Hu ; Chunhui Yang ; Dong Li ; Yi Zhu ; Mengyue Liu

  • Author_Institution
    Software Quality Eng. Res. Center, CEPREI, Guangzhou, China
  • fYear
    2013
  • fDate
    18-20 June 2013
  • Firstpage
    116
  • Lastpage
    124
  • Abstract
    Nowadays the application status of Software-Intensive Systems(SISs) introduces a category of system failure caused by unforeseen operation or environment change. Generally speaking this kind of failure can be observed as system emergent behavior or degraded running. Because it relates to both the running time and state, it is called Time/State(TS)-based SISs failure. Moreover it is one of the significant sources of SISs failure. However the related researches are few. This paper presents the life cycle of software-related failure of SISs firstly. Secondly it analyzes the TS-based SISs failure mechanism and establishes the corresponding model. Moreover it introduces the traditional verification methods of SISs. Furthermore it presents the definition, classification and ontology representation of TS-based SISs failure mode. The instance validation shows the existence of TS-based SISs failure and feasibility of detecting the failure by using combined test method primarily. Finally this paper analyzes the problems and prospects the future researches.
  • Keywords
    failure analysis; formal verification; ontologies (artificial intelligence); pattern classification; program testing; software fault tolerance; failure detection; ontology representation; pattern classification; software failure life cycle; software intensive system; time/state-based SIS failure mode; verification method; Electric variables measurement; Hardware; Reliability engineering; Software; Software reliability; Stress; failure mode; ontology; reliability test; software testing; softwareintensive systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Security and Reliability-Companion (SERE-C), 2013 IEEE 7th International Conference on
  • Conference_Location
    Gaithersburg, MD
  • Print_ISBN
    978-1-4799-2924-5
  • Type

    conf

  • DOI
    10.1109/SERE-C.2013.32
  • Filename
    6616333