Title :
Multiple-Bug Oriented Fault Localization: A Parameter-Based Combination Approach
Author :
Zheng Wei ; Bai Han
Author_Institution :
Coll. of Software Eng. & Micro-Electron., Xi´an, China
Abstract :
To improve the efficiency of localization technique, a parameter combination approach to direct multiple faults localization is proposed in this paper. We consider bisection methods as clustering rules to partition failed test cases into smaller fault-focused clusters with different kinds of combinations. Correlation coefficient can be a tolerance to accept or reject that one cluster aims at specific faults. A statistical approach, a cross tab-based technique will be adopted to help find each bug in a code block soon after. An efficiency comparison between parameter-based technique and Tarantula (using one-bug-at-a-time strategy) on the Siemens Suite will be carried out. The result in this paper implies that more bugs a program contains, more efficient Parameter-Based Combination technique (hereafter referred to as PBC) is. That means PBC has a better performance in multiple faults localization field.
Keywords :
fault location; pattern clustering; program debugging; software fault tolerance; PBC; Siemens Suite; clustering rules; code block; correlation coefficient; crosstab-based technique; fault-focused clusters; multiple fault localization; multiple-bug oriented fault localization; parameter-based combination; parameter-based combination technique; statistical approach; Computer bugs; Correlation; Correlation coefficient; Debugging; Educational institutions; Mathematical model; Software; Fault localization; Multiple bugs; Parameter combination; Statistical approach;
Conference_Titel :
Software Security and Reliability-Companion (SERE-C), 2013 IEEE 7th International Conference on
Conference_Location :
Gaithersburg, MD
Print_ISBN :
978-1-4799-2924-5
DOI :
10.1109/SERE-C.2013.18