Title :
Nonlinearly Constrained MRFs: Exploring the Intrinsic Dimensions of Higher-Order Cliques
Author :
Yun Zeng ; Chaohui Wang ; Soatto, Stefano ; Shing-Tung Yau
Author_Institution :
Harvard Univ., Cambridge, MA, USA
Abstract :
This paper introduces an efficient approach to integrating non-local statistics into the higher-order Markov Random Fields (MRFs) framework. Motivated by the observation that many non-local statistics (e.g., shape priors, color distributions) can usually be represented by a small number of parameters, we reformulate the higher-order MRF model by introducing additional latent variables to represent the intrinsic dimensions of the higher-order cliques. The resulting new model, called NC-MRF, not only provides the flexibility in representing the configurations of higher-order cliques, but also automatically decomposes the energy function into less coupled terms, allowing us to design an efficient algorithmic framework for maximum a posteriori (MAP) inference. Based on this novel modeling/ inference framework, we achieve state-of-the-art solutions to the challenging problems of class-specific image segmentation and template-based 3D facial expression tracking, which demonstrate the potential of our approach.
Keywords :
Markov processes; face recognition; image segmentation; inference mechanisms; random processes; MAP inference; NC-MRF model; algorithmic framework; class-specific image segmentation; energy function; higher-order MRF model; higher-order Markov random field framework; higher-order cliques; intrinsic dimension representation; latent variables; maximum a posteriori inference; modeling framework; nonlinearly constrained MRF; nonlocal statistics; template-based 3D facial expression tracking; Algorithm design and analysis; Approximation algorithms; Inference algorithms; Linear programming; Optimization; Principal component analysis; Shape; 3D Shape Tracking; Higher-order Markov Random Fields; MAP Inference; Segmentation;
Conference_Titel :
Computer Vision and Pattern Recognition (CVPR), 2013 IEEE Conference on
Conference_Location :
Portland, OR
DOI :
10.1109/CVPR.2013.223