• DocumentCode
    640052
  • Title

    Retired-page utilization in write-once memory — A coding perspective

  • Author

    Berman, Amit ; Birk, Yitzhak

  • Author_Institution
    Electr. Eng. Dept., Technion - Israel Inst. of Technol., Haifa, Israel
  • fYear
    2013
  • fDate
    7-12 July 2013
  • Firstpage
    1062
  • Lastpage
    1066
  • Abstract
    In write-once memory (e.g., Flash), a cell´s level can only be raised, and erasure is only in bulk. The total number of erasures (endurance) is limited, and drops sharply with technology shrinkage and with cell-capacity increase. The normalized write capacity (ratio of total amount of data that can be written to storage capacity) drops similarly. Various coding schemes enable overwrites at the expense of storage capacity. With all of them, whenever desired data cannot be written to its current page, the page is “retired” for subsequent erasure. Interestingly, however, a retired page can still be used for writing other data, and it has been proposed to try and use retired pages. Simulation results are promising. In this paper, after briefly presenting Retired Page Utilization, we cast it as a cross-page coding technique. We employ Markovian analysis to derive the expected number of random-data writes with RPU, and show how the required state space can sometimes be substantially reduced.
  • Keywords
    encoding; flash memories; Markovian analysis; coding perspective; cross page coding technique; erasures endurance; retired page utilization; storage capacity; technology shrinkage; write once memory; Computer architecture; Encoding; Flash memories; Markov processes; Microprocessors; Noise measurement; Writing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Theory Proceedings (ISIT), 2013 IEEE International Symposium on
  • Conference_Location
    Istanbul
  • ISSN
    2157-8095
  • Type

    conf

  • DOI
    10.1109/ISIT.2013.6620389
  • Filename
    6620389