Title :
Exact-repair regenerating codes via layered erasure correction and block designs
Author :
Chao Tian ; Aggarwal, Vaneet ; Vaishampayan, Vinay A.
Author_Institution :
AT&T Labs.-Res., Shannon Lab., Florham Park, NJ, USA
Abstract :
A new class of exact-repair regenerating codes is constructed by combining two layers of erasure correction codes together with combinatorial block designs. The proposed codes have the “uncoded repair” property where the nodes participating in the repair simply transfer part of the stored data directly, without performing any computation. The layered error correction structure results in a low-complexity decoding process. An analysis of our coding scheme is presented. This construction is able to achieve better performance than timesharing between the minimum storage regenerating codes and the minimum repair-bandwidth regenerating codes.
Keywords :
decoding; error correction codes; coding scheme; combinatorial block designs; erasure correction codes; exact-repair regenerating codes; layered erasure correction; layered error correction structure; low-complexity decoding process; uncoded repair property; Bandwidth; Decoding; Encoding; Maintenance engineering; Network coding; Vectors;
Conference_Titel :
Information Theory Proceedings (ISIT), 2013 IEEE International Symposium on
Conference_Location :
Istanbul
DOI :
10.1109/ISIT.2013.6620463