Title :
Tight bounds for universal compression of large alphabets
Author :
Acharya, Jayadev ; Das, Hirakendu ; Jafarpour, Ashkan ; Orlitsky, Alon ; Suresh, A.T.
Abstract :
Over the past decade, several papers, e.g., [1-7] and references therein, have considered universal compression of sources over large alphabets, often using patterns to avoid infinite redundancy. Improving on previous results, we prove tight bounds on expected- and worst-case pattern redundancy, in particular closing a decade-long gap and showing that the worst-case pattern redundancy of i.i.d. distributions is Θ(n1/3)†.
Keywords :
data compression; statistical distributions; expected-pattern redundancy; i.i.d. distributions; infinite redundancy; tight bounds; universal large alphabet compression; worst-case pattern redundancy; Encoding; Entropy; Equations; Mathematical model; Redundancy; Upper bound;
Conference_Titel :
Information Theory Proceedings (ISIT), 2013 IEEE International Symposium on
Conference_Location :
Istanbul
DOI :
10.1109/ISIT.2013.6620751