DocumentCode :
64073
Title :
Reducing Thermal Carrier Spreading in InP Quantum Dot Lasers
Author :
Kasim, Makarimi ; Elliott, Stella N. ; Krysa, Andrey B. ; Smowton, Peter M.
Author_Institution :
Sch. of Phys. & Astron., Cardiff Univ., Cardiff, UK
Volume :
21
Issue :
6
fYear :
2015
fDate :
Nov.-Dec. 2015
Firstpage :
1
Lastpage :
6
Abstract :
Record low values in this material system of threshold current density, particularly at elevated temperature, are presented for InP quantum dot lasers. Lasers with Ga0.58In0.42P in the dot upper confining layer have the lowest threshold current densities, 138 A·cm-2 at 300 K, and 235 A·cm-2 at 350 K (77 °C) (2-mm lasers, uncoated facets). Gain-current density data suggests laser performance with an upper confining layer of GaxIn1-xP with x = 0.54, 0.56 or 0.58 would be similar if not for the very low internal optical mode loss, αi of samples with x = 0.56 and 0.58. Gain measurements at fixed inversion level suggest that increasing x content in GaxIn1-xP increases gain at fixed inversion level but samples with x = 0.54 also exhibit reduced recombination current density. The increasing recombination current density at elevated temperature due to thermal carrier spreading is significantly reduced in samples with x = 0.56 and x = 0.58 but measurements at common operating points attribute this largely to the reduced αi for these samples and given the same αI, samples with x = 0.54, 0.56 and 0.58 would all benefit from reduced effects due to thermal carrier spreading compared to x = 0.52.
Keywords :
III-V semiconductors; current density; gallium compounds; indium compounds; laser modes; optical losses; quantum dot lasers; GaxIn1-xP; dot upper confining layer; gain measurements; gain-current density; internal optical mode loss; inversion level; quantum dot lasers; recombination current density; temperature 300 K; temperature 350 K; thermal carrier spreading; threshold current density; Absorption; Current density; Gallium; Quantum dot lasers; Temperature measurement; Threshold current; InP self-assembled quantum dots; Quantum dot devices; quantum dot devices; semiconductor laser; short wavelength lasers; temperature sensitivity; threshold current density;
fLanguage :
English
Journal_Title :
Selected Topics in Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
1077-260X
Type :
jour
DOI :
10.1109/JSTQE.2015.2403716
Filename :
7041162
Link To Document :
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