A new-type THz null-ellipsometer based on quasi-optical transmission line and components

Author

Galuza, A.A. ; Kiseliov, V.K. ; Kolenov, I.V. ; Kuleshov, Ye.M. ; Mizrakhy, S.V. ; Serebryanskiy, S.Yu.

Author_Institution

Inst. of Electrophys. & Radiat. Technol., Kharkov, Ukraine

fYear

2013

fDate

23-28 June 2013

Firstpage

526

Lastpage

528

Abstract

Ellipsometry is a set of noncontact and nondestructive experimental techniques for studying physical properties and structural parameters of various materials and systems [1-3]. Ellipsometry is based on the phenomena of radiation polarization state change at reflecting from a surface. At present, extension of the probing radiation frequency-range is one of the major development lines of ellipsometric experimental technique. Each spectral interval requires specific elements and design though general configuration remains the same.

Keywords

S-parameters; ellipsometers; ellipsometry; light propagation; light reflection; light transmission; microwave photonics; optical elements; terahertz wave devices; transmission lines; THz null ellipsometer; ellipsometry; noncontact experimental technique; nondestructive experimental technique; physical property; quasi-optical transmission line; quasioptical component; radiation polarization state change; spectral interval; structural parameter; surface reflection; Detectors; Ellipsometry; Materials; Optical attenuators; Optical polarization; Optical reflection; Transmission line measurements;

fLanguage

English

Publisher

ieee

Conference_Titel

Physics and Engineering of Microwaves, Millimeter and Submillimeter Waves (MSMW), 2013 International Kharkov Symposium on

Conference_Location

Kharkiv

Print_ISBN

978-1-4799-1066-3

Type

conf

DOI

10.1109/MSMW.2013.6622128

Filename

6622128