Methods of estimation surface roughness

Author

Shmatko, A.A.

Author_Institution

Kharkov Aviation Inst., Nat. Aerosp. Univ. named after N.E. Zhukovsky, Kharkiv, Ukraine

fYear

2013

fDate

23-28 June 2013

Firstpage

637

Lastpage

639

Abstract

Currently, the development of new methods for estimating the parameters statistically rough surfaces is an important task: in engineering, the manufacture of products at different stages of technological process, as well as in any industry where the need to control surface finishes. In the proposed work the two methods to estimate the parameters of a statistically rough surfaces. The first is to evaluate the two-dimensional correlation function of rough surfaces calculated by speckle interferometric images formed by reflected coherent radiation. In the second method, based on the analysis of the speckle pattern with both diffuse and specular registered component.

Keywords

electronic speckle pattern interferometry; estimation theory; parameter estimation; surface roughness; surface topography measurement; diffuse registered component; estimation methods; reflected coherent radiation; speckle interferometric images; speckle pattern; specular registered component; surface roughness; two dimensional correlation function; Adaptive optics; Optical imaging; Optical interferometry; Rough surfaces; Speckle; Surface roughness; Surface treatment;

fLanguage

English

Publisher

ieee

Conference_Titel

Physics and Engineering of Microwaves, Millimeter and Submillimeter Waves (MSMW), 2013 International Kharkov Symposium on

Conference_Location

Kharkiv

Print_ISBN

978-1-4799-1066-3

Type

conf

DOI

10.1109/MSMW.2013.6622147

Filename

6622147