Title :
Methods of estimation surface roughness
Author_Institution :
Kharkov Aviation Inst., Nat. Aerosp. Univ. named after N.E. Zhukovsky, Kharkiv, Ukraine
Abstract :
Currently, the development of new methods for estimating the parameters statistically rough surfaces is an important task: in engineering, the manufacture of products at different stages of technological process, as well as in any industry where the need to control surface finishes. In the proposed work the two methods to estimate the parameters of a statistically rough surfaces. The first is to evaluate the two-dimensional correlation function of rough surfaces calculated by speckle interferometric images formed by reflected coherent radiation. In the second method, based on the analysis of the speckle pattern with both diffuse and specular registered component.
Keywords :
electronic speckle pattern interferometry; estimation theory; parameter estimation; surface roughness; surface topography measurement; diffuse registered component; estimation methods; reflected coherent radiation; speckle interferometric images; speckle pattern; specular registered component; surface roughness; two dimensional correlation function; Adaptive optics; Optical imaging; Optical interferometry; Rough surfaces; Speckle; Surface roughness; Surface treatment;
Conference_Titel :
Physics and Engineering of Microwaves, Millimeter and Submillimeter Waves (MSMW), 2013 International Kharkov Symposium on
Conference_Location :
Kharkiv
Print_ISBN :
978-1-4799-1066-3
DOI :
10.1109/MSMW.2013.6622147
