Title :
Improving the detection and localization of duplicated regions in copy-move image forgery
Author :
Jaberi, Maryam ; Bebis, G. ; Hussain, Mutawarra ; Muhammad, Ghulam
Author_Institution :
Comput. Sci. & Eng. Dept., Univ. of Nevada, Reno, NV, USA
Abstract :
Using keypoint-based features, such as SIFT features, for detecting copy-move image forgeries has yielded promising results. In this paper, our emphasis is on improving the detection and localization of duplicated regions using more powerful keypoint-based features. In this context, we have adopted a more powerful set of keypoint-based features, called MIFT, which share the properties of SIFT features but also are invariant to mirror reflection transformations. To improve localization, we propose estimating the parameters of the affine transformation between copied and pasted regions more accurately using an iterative scheme which finds additional keypoint matches incrementally. To reduce the number of false positives and negatives, we propose using “dense” MIFT features, instead of standard pixel correlation, along with hystereresis thresholding and morphological operations. The proposed approach has been evaluated and compared with competitive approaches through a comprehensive set of experiments using a large dataset of real images. Our results indicate that our method can detect duplicated regions in copy-move image forgery with higher accuracy, especially when the size of the duplicated region is small.
Keywords :
affine transforms; correlation methods; feature extraction; fraud; image forensics; image matching; image segmentation; iterative methods; mathematical morphology; object detection; parameter estimation; realistic images; SIFT features; affine transformation; blind image forensic; competitive approaches; copied regions; copy-move image forgery detection; dense MIFT features; duplicated region detection; duplicated region localization; hystereresis thresholding; iterative scheme; keypoint matches; keypoint-based features; morphological operations; parameter estimation; pasted regions; real images; reflection transformations; standard pixel correlation; Accuracy; Feature extraction; Forgery; Hysteresis; Mirrors; Reflection; Standards; MIFT; SIFT; blind image forensics; copy-move image forgery; matching;
Conference_Titel :
Digital Signal Processing (DSP), 2013 18th International Conference on
Conference_Location :
Fira
DOI :
10.1109/ICDSP.2013.6622700