Title :
Generalized analysis of reflection parameters meters
Author :
Palchun, Yu.A. ; Evgrafov, V.I. ; Kaverin, A.M. ; Vladimirova, S.V.
Author_Institution :
FGUP SNIIM, Novosibirsk, Russia
Abstract :
Problems of generalized analysis of MW-range reflection parameters meters are considered.
Keywords :
mathematical analysis; reflectometers; MW-range reflection parameters meters; generalized analysis; Bismuth; Circuit analysis; Generators; Microwave circuits; Reflection;
Conference_Titel :
Actual Problems of Electronics Instrument Engineering (APEIE), 2012 11th International Conference on
Conference_Location :
Novosibirsk
Print_ISBN :
978-1-4673-2842-5
DOI :
10.1109/APEIE.2012.6628949