Title :
Generalized analysis of processes parameters measurement in SQM
Author :
Palchun, Yu.A. ; Serykh, V.I. ; Yakimova, I.V. ; Kvitkova, I.G.
Abstract :
Based on the generalized model of measurement main equations for process measurement in SQM are obtained.
Keywords :
measurement; production engineering computing; quality management; SQM; process parameters measurement; software quality management; Conferences; Equations;
Conference_Titel :
Actual Problems of Electronics Instrument Engineering (APEIE), 2012 11th International Conference on
Conference_Location :
Novosibirsk
Print_ISBN :
978-1-4673-2842-5
DOI :
10.1109/APEIE.2012.6628973
