Title :
Experimental validation of DAC with nested bus-splitting EFM4 DDSM
Author :
Hongjia Mo ; Kennedy, Michael Peter ; O´Brien, Vincent ; Mullane, Brendan
Author_Institution :
Dept. of Electr. & Electron. Eng., Univ. Coll. Cork, Cork, Ireland
Abstract :
This paper presents measured results for a fourth order nested bus-splitting Error Feedback Modulator (EFM4) with dynamic element matching and a four-bit DAC. The nested bus-splitting EFM4 can run approximately 38% faster than a conventional EFM4 on a Xilinx Virtex 5, with negligible degradation in spectral performance.
Keywords :
circuit feedback; delta-sigma modulation; Xilinx Virtex 5; digital delta-sigma modulators; dynamic element matching; four-bit DAC; fourth order nested bus-splitting error feedback modulator; nested bus-splitting EFM4 DDSM; spectral performance; word length 4 bit; Delta-sigma modulation; Educational institutions; Hardware; Modulation; Signal to noise ratio; Throughput;
Conference_Titel :
Circuit Theory and Design (ECCTD), 2013 European Conference on
Conference_Location :
Dresden
DOI :
10.1109/ECCTD.2013.6662198
