Focused calibration for advanced RF test with embedded RF detectors

Author

Quoc-Tai Duong ; Dabrowski, Jerzy J.

Author_Institution

Dept. of Electr. Eng., Linkoping Univ., Linkoping, Sweden

fYear

2013

fDate

8-12 Sept. 2013

Firstpage

1

Lastpage

4

Abstract

In this paper a technique suitable for on-chip IP3/IP2 RF test by embedded RF detectors is presented. A lack of spectral selectivity of the detectors and diverse nonlinearity of the circuit under test (CUT) impose stiff constraints on the respective test measurements for which focused calibration approach and a support by customized models of CUT is necessary. Also cancellation of second-order intermodulation effects produced by the detectors under the two-tone test is required. The test technique is introduced using a polynomial model of the CUT. Simulation example of a practical CMOS LNA under IP3/IP2 RF test with embedded RF detectors is presented showing a good measurement accuracy.

Keywords

CMOS analogue integrated circuits; intermodulation; low noise amplifiers; CMOS LNA; CUT polynomial model; advanced RF test; calibration approach; circuit-under-test; detector spectral selectivity; diverse nonlinearity; embedded RF detectors; on-chip IP3-IP2 RF test; second-order intermodulation effect cancellation; test measurement; two-tone test; CMOS integrated circuits; Calibration; Detectors; Gain; High definition video; Radio frequency; System-on-chip; BIST; DfT; IP3 test; RF amplitude detector; calibration;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuit Theory and Design (ECCTD), 2013 European Conference on

Conference_Location

Dresden

Type

conf

DOI

10.1109/ECCTD.2013.6662259

Filename

6662259