DocumentCode :
64283
Title :
High-Efficiency Full Back Contacted Cells Using Industrial Processes
Author :
Jingbing Dong ; Longzhong Tao ; Yanbin Zhu ; Zhuojian Yang ; Zhengyue Xia ; Sidhu, Rubin ; Guoqiang Xing
Author_Institution :
Solar Technol., Jiangyin, China
Volume :
4
Issue :
1
fYear :
2014
fDate :
Jan. 2014
Firstpage :
130
Lastpage :
133
Abstract :
Full-size (156 ×156 mm2) interdigitated back contact (IBC) solar cells have been developed with conventional industry processes. With PC1D simulation and short-flow experiment verification, we found that the tunnel junction shunting of rear n+/p+ could be mitigated significantly by controlling the boron surface concentration; therefore, it is not necessary to form a gap between rear emitter and back surface field. Made by a novel yet relative simple process, the IBC cells preliminarily achieved 19.65% best efficiency with Jsc and Voc as high as 40.5 mA/cm2 and 655 mV, respectively, while FF was only 73.9% due to the low pseudo fill factor (Pff) and high series resistance. Through the optimization of the rear pattern process, Pff was improved up to 82.5% and FF up to 77%. With further optimization of emitter, front surface field, passivation, and rear pattern design, the cells potentially can achieve up to 22.0% efficiency in the near future.
Keywords :
optimisation; passivation; solar cells; PC1D simulation; back surface field; boron surface concentration; emitter optimization; front surface field; full-size interdigitated back contact solar cells; high-efficiency full back contacted cells; industrial processes; passivation; pseudofill factor; rear emitter; rear pattern design; rear pattern process optimization; series resistance; short-flow experiment verification; tunnel junction shunting; Doping; Junctions; Optimization; Photovoltaic cells; Photovoltaic systems; Surface treatment; Conventional process; high efficiency; interdigitated back contact (IBC) cells; tunnel junction shunting (TJS);
fLanguage :
English
Journal_Title :
Photovoltaics, IEEE Journal of
Publisher :
ieee
ISSN :
2156-3381
Type :
jour
DOI :
10.1109/JPHOTOV.2013.2285623
Filename :
6645399
Link To Document :
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