Title :
Non-destructive microwave characterization and imaging of dielectric materials using a near field technique
Author :
Jamal, Rammal ; Olivier, Tantot ; Nicolas, Delhote ; Serge, Verdeyme
Author_Institution :
XLIM, Univ. of Limoges, Limoges, France
Abstract :
We describe a contactless technique for dielectric permittivity characterization using a resonant near-field scanning microwave microscope. By measuring the shift in the system´s resonant frequency as we scan over an insulating sample, we obtain quantitative images of dielectric variations. This system is composed of a probe coupled to a dielectric resonator.
Keywords :
dielectric materials; dielectric resonators; insulating materials; microscopes; microwave devices; microwave imaging; permittivity measurement; contactless technique; dielectric material; dielectric permittivity characterization; dielectric resonator; insulating sample; nondestructive microwave characterization; nondestructive microwave imaging; quantitative imaging; resonant frequency measurement; resonant near-field scanning microwave microscope; Dielectric constant; Dielectric measurement; Microscopy; Permittivity; Probes; Resonant frequency; dielectric cartography; dielectric constant; dielectric material; dielectric resonator; near field microscopy;
Conference_Titel :
Microwave Symposium (MMS), 2013 13th Mediterranean
Conference_Location :
Saida
DOI :
10.1109/MMS.2013.6663074
