Title :
An overview of testing generation methods for protocol conformance testing
Author :
Liang Wang ; Xinhua Xu ; Changjie Hu
Author_Institution :
Dept. of Inf. Technol., Hubei Polytech. Inst., Xiao Gan, China
Abstract :
On the basis of introducing protocol testing and conformance testing, this paper mainly focuses on reviewing the testing generation methods based on Finite State Machine model (FSM), Extended Finite State Machine model (EFSM), Deterministic Finite State Machine model (DFSM) and Non-Deterministic Finite State Machine model (NDFSM) and so on. In conclusion, this paper points out some problems for further research and the development trends in this field.
Keywords :
conformance testing; finite state machines; protocols; deterministic finite state machine model; extended finite state machine model; nondeterministic finite state machine model; protocol conformance testing; research and development; testing generation methods; Automata; Formal specifications; Mathematical model; Organizations; Protocols; Standards; Testing; DFSM; EFSM; FSM; NDFSM; conformance testing; formal specification; testing generation;
Conference_Titel :
Signal Processing, Communication and Computing (ICSPCC), 2013 IEEE International Conference on
Conference_Location :
KunMing
DOI :
10.1109/ICSPCC.2013.6663880
