A stable key generation from PUF responses with a Fuzzy Extractor for cryptographic authentications

Author

Taniguchi, Masaaki ; Shiozaki, M. ; Kubo, Hiroshi ; Fujino, T.

Author_Institution

Ritsumeikan Univ., Kusatsu, Japan

fYear

2013

fDate

1-4 Oct. 2013

Firstpage

525

Lastpage

527

Abstract

Physical Unclonable Functions (PUFs) extract inherent characteristics caused by fabrication process variations, and generate unique challenge-response pairs. Some bits of PUF responses are slightly unstable, then the Fuzzy Extractors (FEs) are used to correct the error bits. This paper proposes the new soft-decision FEs considering the instability caused by voltage fluctuation. We applied this method to our novel RG-DTM PUF fabricated by 0.18 μm CMOS technology. It was demonstrated that the block error rate is reduced to 1/10 compared to the conventional soft-decision FE.

Keywords

CMOS integrated circuits; cryptography; CMOS technology; PUF response; RG-DTM PUF; block error rate; complimentary metal oxide semiconductor technology; cryptographic authentications; fuzzy extractor; physical unclonable function; size 0.18 mum; soft-decision FE; stable key generation; voltage fluctuation; Authentication; Error analysis; Error correction; Fluctuations; Iron; Voltage fluctuations; Environmental Fluctuation; Fuzzy Extractor; Key Generation; Physical Unclonable Function; Soft-Decision;

fLanguage

English

Publisher

ieee

Conference_Titel

Consumer Electronics (GCCE), 2013 IEEE 2nd Global Conference on

Conference_Location

Tokyo

Print_ISBN

978-1-4799-0890-5

Type

conf

DOI

10.1109/GCCE.2013.6664910

Filename

6664910