DocumentCode :
644534
Title :
High-speed THz semiconductor imaging camera
Author :
Muravev, Vitaliy ; Tsydynzhapov, G. ; Fortunatov, A. ; Kukushkin, I.
Author_Institution :
Terasense Dev. Labs., Chernogolovka, Russia
fYear :
2013
fDate :
1-6 Sept. 2013
Firstpage :
1
Lastpage :
1
Abstract :
A high-speed room temperature THz imaging system is developed. The sensor consists of an array (64×64) of plasmonic semiconductor detectors. The detectors have broadband responsivity of up to 20 V/W in the frequency range 10 GHz - 1 THz. Pixel-to-pixel deviation of the sensor parameters is not larger than 20%. The sensor with an amplification electrical circuit provide shot times of 100 ms. The sensor is fabricated using standard semiconductor fab cycles. Therefore, the device is an ideal object for low-cost mass production.
Keywords :
cameras; terahertz wave imaging; amplification electrical circuit; frequency 10 GHz to 1 THz; frequency range; high-speed THz semiconductor imaging camera; pixel-to-pixel deviation; plasmonic semiconductor detectors; semiconductor fab cycles; sensor parameters; Biology; Detectors; Electromagnetics; Imaging; Plasmons; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), 2013 38th International Conference on
Conference_Location :
Mainz
Type :
conf
DOI :
10.1109/IRMMW-THz.2013.6665502
Filename :
6665502
Link To Document :
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