• DocumentCode
    644534
  • Title

    High-speed THz semiconductor imaging camera

  • Author

    Muravev, Vitaliy ; Tsydynzhapov, G. ; Fortunatov, A. ; Kukushkin, I.

  • Author_Institution
    Terasense Dev. Labs., Chernogolovka, Russia
  • fYear
    2013
  • fDate
    1-6 Sept. 2013
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    A high-speed room temperature THz imaging system is developed. The sensor consists of an array (64×64) of plasmonic semiconductor detectors. The detectors have broadband responsivity of up to 20 V/W in the frequency range 10 GHz - 1 THz. Pixel-to-pixel deviation of the sensor parameters is not larger than 20%. The sensor with an amplification electrical circuit provide shot times of 100 ms. The sensor is fabricated using standard semiconductor fab cycles. Therefore, the device is an ideal object for low-cost mass production.
  • Keywords
    cameras; terahertz wave imaging; amplification electrical circuit; frequency 10 GHz to 1 THz; frequency range; high-speed THz semiconductor imaging camera; pixel-to-pixel deviation; plasmonic semiconductor detectors; semiconductor fab cycles; sensor parameters; Biology; Detectors; Electromagnetics; Imaging; Plasmons; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), 2013 38th International Conference on
  • Conference_Location
    Mainz
  • Type

    conf

  • DOI
    10.1109/IRMMW-THz.2013.6665502
  • Filename
    6665502