DocumentCode
644534
Title
High-speed THz semiconductor imaging camera
Author
Muravev, Vitaliy ; Tsydynzhapov, G. ; Fortunatov, A. ; Kukushkin, I.
Author_Institution
Terasense Dev. Labs., Chernogolovka, Russia
fYear
2013
fDate
1-6 Sept. 2013
Firstpage
1
Lastpage
1
Abstract
A high-speed room temperature THz imaging system is developed. The sensor consists of an array (64×64) of plasmonic semiconductor detectors. The detectors have broadband responsivity of up to 20 V/W in the frequency range 10 GHz - 1 THz. Pixel-to-pixel deviation of the sensor parameters is not larger than 20%. The sensor with an amplification electrical circuit provide shot times of 100 ms. The sensor is fabricated using standard semiconductor fab cycles. Therefore, the device is an ideal object for low-cost mass production.
Keywords
cameras; terahertz wave imaging; amplification electrical circuit; frequency 10 GHz to 1 THz; frequency range; high-speed THz semiconductor imaging camera; pixel-to-pixel deviation; plasmonic semiconductor detectors; semiconductor fab cycles; sensor parameters; Biology; Detectors; Electromagnetics; Imaging; Plasmons; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), 2013 38th International Conference on
Conference_Location
Mainz
Type
conf
DOI
10.1109/IRMMW-THz.2013.6665502
Filename
6665502
Link To Document