Title :
Background corrected transmittance and reflectance measurements in the FIR
Author :
Kehrt, M. ; Muller, Rudolf ; Steiger, A. ; Monte, C.
Author_Institution :
Phys.-Tech. Bundesanstalt (PTB), Berlin, Germany
Abstract :
Transmittance and reflectance measurements with Fourier transform spectrometers in the MIR and FIR can exhibit significant deviations when working with cooled detectors. By measuring at two flux levels and by using an appropriate evaluation scheme systematic deviations can be largely reduced in the range from 25 μm up to 1000 μm.
Keywords :
Fourier transform spectrometers; infrared spectroscopy; light transmission; optical variables measurement; reflectivity; Fourier transform spectrometer; background corrected transmittance; far infrared reflectance measurement; far infrared transmittance measurement; wavelength 25 mum to 1000 mum; Detectors; Liquids; Rotation measurement;
Conference_Titel :
Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), 2013 38th International Conference on
Conference_Location :
Mainz
DOI :
10.1109/IRMMW-THz.2013.6665687
