Title :
Methods for determining the exposure to THz radiation utilizing CMOS-based detectors
Author :
Statnikov, Konstantin ; Al Hadi, Richard ; Clemens, Markus ; Hansen, Volkert ; Spathmann, Oliver ; Streckert, Joachim ; Zang, Martin ; Pfeiffer, Ullrich R.
Author_Institution :
Univ. of Wuppertal, Wuppertal, Germany
Abstract :
This paper presents methods enabling the examination of a THz system for its compliance with legal exposure limits. The test process is divided into two steps: first, THz hotspot localization using a lens-coupled THz CMOS camera, followed by lateral power density measurement employing a CMOS detector with a 87μm × 100μm on-chip patch antenna. At the hotspot location, the measured power density distribution of a focused beam at 0.655 THz is presented.
Keywords :
CMOS image sensors; lenses; terahertz wave imaging; CMOS-based detectors; THz radiation; compliance; frequency 0.655 THz; hotspot localization; lateral power density measurement; lens-coupled THz CMOS camera; CMOS integrated circuits; Cameras; Density measurement; Detectors; Patch antennas; Power measurement; Power system measurements; CMOS; THz direct detection; THz imaging; distributed resistive self-mixing; exposure examination;
Conference_Titel :
Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), 2013 38th International Conference on
Conference_Location :
Mainz
DOI :
10.1109/IRMMW-THz.2013.6665716
