DocumentCode :
644830
Title :
Single flange 2-port design for THz integrated circuit S-parameter characterization
Author :
Hanning, Johanna ; Stenarson, J. ; Yhland, K. ; Sobis, P. ; Bryllert, Tomas ; Stake, Jan
Author_Institution :
Gigahertz Centre, Goteborg, Sweden
fYear :
2013
fDate :
1-6 Sept. 2013
Firstpage :
1
Lastpage :
2
Abstract :
A single flange 2-port TRL calibration and measurement setup for accurate THz S-parameter characterization of integrated membrane circuit devices is proposed. The proposed setup facilitates shorter access waveguides, which greatly improves the calibration uncertainty.
Keywords :
S-parameters; calibration; integrated circuit design; submillimetre wave integrated circuits; terahertz wave devices; waveguides; THz integrated circuit S-parameter characterization; access waveguides; calibration uncertainty; integrated membrane circuit devices; measurement setup; single flange 2-port TRL calibration; single flange 2-port design; Calibration; Fabrication; Flanges; Reflection; Scattering parameters; Standards; Uncertainty;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), 2013 38th International Conference on
Conference_Location :
Mainz
Type :
conf
DOI :
10.1109/IRMMW-THz.2013.6665800
Filename :
6665800
Link To Document :
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