DocumentCode :
64556
Title :
Photometric Stereo Using Sparse Bayesian Regression for General Diffuse Surfaces
Author :
Ikehata, Satoshi ; Wipf, David ; Matsushita, Yuki ; Aizawa, K.
Author_Institution :
Dept. of Inf. Sci. & Technol., Univ. of Tokyo, Tokyo, Japan
Volume :
36
Issue :
9
fYear :
2014
fDate :
Sept. 2014
Firstpage :
1816
Lastpage :
1831
Abstract :
Most conventional algorithms for non-Lambertian photometric stereo can be partitioned into two categories. The first category is built upon stable outlier rejection techniques while assuming a dense Lambertian structure for the inliers, and thus performance degrades when general diffuse regions are present. The second utilizes complex reflectance representations and non-linear optimization over pixels to handle non-Lambertian surfaces, but does not explicitly account for shadows or other forms of corrupting outliers. In this paper, we present a purely pixel-wise photometric stereo method that stably and efficiently handles various non-Lambertian effects by assuming that appearances can be decomposed into a sparse, non-diffuse component (e.g., shadows, specularities, etc.) and a diffuse component represented by a monotonic function of the surface normal and lighting dot-product. This function is constructed using a piecewise linear approximation to the inverse diffuse model, leading to closed-form estimates of the surface normals and model parameters in the absence of non-diffuse corruptions. The latter are modeled as latent variables embedded within a hierarchical Bayesian model such that we may accurately compute the unknown surface normals while simultaneously separating diffuse from non-diffuse components. Extensive evaluations are performed that show state-of-the-art performance using both synthetic and real-world images.
Keywords :
belief networks; photometry; piecewise linear techniques; regression analysis; stereo image processing; complex reflectance representations; dense Lambertian structure; general diffuse surfaces; hierarchical Bayesian model; inverse diffuse model; nonlinear optimization; photometric stereo method; piecewise linear approximation; sparse Bayesian regression; stable outlier rejection techniques; Bayes methods; Computational modeling; Lighting; Materials; Mathematical model; Robustness; Vectors; Photometric stereo; piecewise linear regression; sparse bayesian learning; sparse regression;
fLanguage :
English
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher :
ieee
ISSN :
0162-8828
Type :
jour
DOI :
10.1109/TPAMI.2014.2299798
Filename :
6714613
Link To Document :
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