Title :
Distribution fault location using wide-area voltage magnitude measurements
Author :
Hossain, Shahadat ; Hao Zhu ; Overbye, Thomas
Author_Institution :
Electr. & Comput. Eng, Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
Abstract :
In an effort to increase situational awareness in the electric power grid, Wide-Area Measurement Systems (WAMS) are being implemented. These systems allow the capture of fast-sampled voltage data such as frequency, voltage magnitude, and voltage angle measurements in a low-cost, easily deployable manner. Traditional fault location methods use both current and voltage data. Voltage monitoring devices only collect voltage data, but these sensors can collect this data anywhere along the distribution lines. An iterative simulation-based fault location method using only voltage measurements, from anywhere on the line, is proposed. This technique involves comparing a measured voltage profile of a specific fault type and phase with a calculated voltage profile obtained through simulation of such a fault occurring at various locations with a range of probable fault impedances in the system. The best match is determined using the Euclidean error norm criterion and a threshold error value. The algorithm is successfully demonstrated using a PowerWorld case study.
Keywords :
fault location; gradient methods; power distribution faults; power grids; power system measurement; voltage measurement; Euclidean error norm criterion; PowerWorld case study; WAMS; current; distribution lines; electric power grid; fault impedances; frequency measurements; iterative simulation-based fault location method; threshold error value; voltage angle measurements; voltage data; voltage magnitude measurements; voltage monitoring devices; voltage profile; wide-area measurement systems; Current measurement; Fault location; Frequency measurement; Impedance; Monitoring; Sensors; Voltage measurement; WAMS; distribution system; fault location; voltage monitoring;
Conference_Titel :
North American Power Symposium (NAPS), 2013
Conference_Location :
Manhattan, KS
DOI :
10.1109/NAPS.2013.6666936