Title :
Big snapshot stitching with scarce overlap
Author :
Iliopoulos, Alexandros-Stavros ; Jun Hu ; Pitsianis, Nikos ; Xiaobai Sun ; Gehm, M. ; Brady, David
Author_Institution :
Dept. of Comput. Sci., Duke Univ., Durham, NC, USA
Abstract :
We address certain properties that arise in gigapixel-scale image stitching for snapshot images captured with a novel micro-camera array system, AWARE-2. This system features a greatly extended field of view and high optical resolution, offering unique sensing capabilities for a host of important applications. However, three simultaneously arising conditions pose a challenge to existing approaches to image stitching, with regard to the quality of the output image as well as the automation and efficiency of the image composition process. Put simply, they may be described as the sparse, geometrically irregular, and noisy (S.I.N.) overlap amongst the fields of view of the constituent micro-cameras. We introduce a computational pipeline for image stitching under these conditions, which is scalable in terms of complexity and efficiency. With it, we also substantially reduce or eliminate ghosting effects due to misalignment factors, without entailing manual intervention. Our present implementation of the pipeline leverages the combined use of multicore and GPU architectures. We present experimental results with the pipeline on real image data acquired with AWARE-2.
Keywords :
cameras; image denoising; image fusion; image resolution; multiprocessing systems; AWARE-2; GPU architecture; SIN overlap; big snapshot stitching; complexity; computational pipeline; extended field of view; ghosting effect elimination; ghosting effect reduction; gigapixel-scale image stitching; image composition process; image data; microcamera array system; misalignment factor; multicore architecture; optical resolution; output image quality; scarce overlap; sensing capability; snapshot images; sparse geometrically irregular noisy overlap; Cameras; Feature extraction; Geometry; Noise; Noise measurement; Pipelines; Robustness;
Conference_Titel :
High Performance Extreme Computing Conference (HPEC), 2013 IEEE
Conference_Location :
Waltham, MA
Print_ISBN :
978-1-4799-1364-0
DOI :
10.1109/HPEC.2013.6670349