DocumentCode :
646726
Title :
A survey of narrowband IEMI global threats
Author :
Prasad, Santasriya ; Schamiloglu, Edl
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of New Mexico, Albuquerque, NM, USA
fYear :
2013
fDate :
5-9 Aug. 2013
Firstpage :
397
Lastpage :
400
Abstract :
Intentional EMI (IEMI) or high power microwave (HPM) sources have been studied for over 40 years. Originally researchers in the United States and the former Soviet Union dominated the field. Today dozens of countries are actively pursuing programs in developing such sources. Early developments in the field were motivated by researchers pursuing sources with ever-greater output power levels and longer pulse durations (greater energy). The phenomenon of pulse shortening was recognized in the mid 1990´s as a fundamental barrier to this power derby and researchers regrouped to pursue other advances. Virtual prototyping using sophisticated particle-in-cell (PIC) codes was recognized as a critical tool at this time as well for source researchers. Novel advances are now routinely motivated by virtual prototyping. The global field in HPM source research in the last couple of years has been dominated by multispectral sources and phase coherent sources. This presentation will survey recent global advances in narrowband HPM source research.
Keywords :
electromagnetic interference; virtual prototyping; HPM sources; global field; high power microwave source; intentional EMI; narrowband IEMI global threats; output power levels; phase coherent sources; pulse durations; pulse shortening phenomenon; sophisticated particle-in-cell codes; virtual prototyping; Educational institutions; Laboratories; Magnetrons; Narrowband; Oscillators; Plasmas; Virtual prototyping;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility (EMC), 2013 IEEE International Symposium on
Conference_Location :
Denver, CO
ISSN :
2158-110X
Print_ISBN :
978-1-4799-0408-2
Type :
conf
DOI :
10.1109/ISEMC.2013.6670445
Filename :
6670445
Link To Document :
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