Title :
Review of multi-layer graphene nanoribbons for on-chip interconnect applications
Author :
Kumar, Vipin ; Rakheja, Shaloo ; Naeemi, Azad
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
A review of the analytical models for signal transport in multi-layer graphene nanoribbon (GNR) interconnects, current distribution between GNR layers, and a comparison of GNR interconnects against copper is presented here. The multiconductor transmission line (MTL) models and the simplified equivalent distributed RC models presented here consider the realistic effect of having contacts that couple only to the top layer. The MTL models are used to show the distribution of current among different layers along the interconnect length. For digital circuits and interconnect dimensions of interest, it is shown that the equivalent RC models have an error of less than 15% in estimating the interconnect delay. However, for RF circuits where the accurate frequency response is important, it is shown that MTL models are essential. The optimal number of GNR layers to minimize the delay and energy-delay-product (EDP) are derived using the distributed RC models for futuristic technology nodes. Using the predictions made by the International Technology Roadmap for Semiconductors (ITRS), it is shown that for short interconnects, multi-layer GNR with smooth edges can outperform copper.
Keywords :
RC circuits; current distribution; digital circuits; frequency response; graphene; integrated circuit interconnections; multiconductor transmission lines; nanoribbons; EDP; GNR layers; ITRS; International Technology Roadmap for Semiconductors; MTL models; RF circuits; analytical models; current distribution; digital circuits; distributed RC models; energy-delay-product; equivalent RC models; frequency response; interconnect delay; interconnect dimensions; interconnect length; multiconductor transmission line models; multilayer graphene nanoribbons; on-chip interconnect applications; optimal number; signal transport; Analytical models; Capacitance; Copper; Delays; Graphene; Integrated circuit interconnections; Integrated circuit modeling; Graphene; edge roughness; high frequency models; interconnects; multi-conductor transmission lines; multilayer graphene;
Conference_Titel :
Electromagnetic Compatibility (EMC), 2013 IEEE International Symposium on
Conference_Location :
Denver, CO
Print_ISBN :
978-1-4799-0408-2
DOI :
10.1109/ISEMC.2013.6670470