DocumentCode :
646757
Title :
Decompositional electromagnetic analysis of digital interconnects
Author :
Shlepnev, Yuriy
Author_Institution :
Simberian Inc., Las Vegas, NV, USA
fYear :
2013
fDate :
5-9 Aug. 2013
Firstpage :
563
Lastpage :
568
Abstract :
Essential elements of decompositional electromagnetic signal integrity analysis of PCB and packaging interconnects are introduced in the paper. Digital interconnects can be formally divided into transmission line segments and discontinuities or transitions in lines such as via-holes and connectors. Multiport models of the components can be built separately with the electromagnetic analysis and then united into a complete channel model. This technique is known as decompositional electromagnetic analysis. Bandwidth and quality of multiport models, broadband material models, localization of all elements of a channel and systematic validation process are outlined in the paper as the key elements of the decompositional interconnect analysis that lead to successful analysis to measurement correlation from DC up to 50 GHz.
Keywords :
electronics packaging; printed circuit interconnections; PCB interconnects; broadband material models; complete channel model; connectors; decompositional electromagnetic signal integrity analysis; digital interconnects; line discontinuities; line transitions; measurement correlation; multiport models; packaging interconnects; systematic validation process; transmission line segments; via-holes; Analytical models; Computational modeling; Conductors; Dielectric measurement; Dielectrics; Strips; Transmission line measurements;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility (EMC), 2013 IEEE International Symposium on
Conference_Location :
Denver, CO
ISSN :
2158-110X
Print_ISBN :
978-1-4799-0408-2
Type :
conf
DOI :
10.1109/ISEMC.2013.6670476
Filename :
6670476
Link To Document :
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