• DocumentCode
    646784
  • Title

    Signal integrity enhancement of high-speed digital interconnect with discontinuous and asymmetric structures for mobile applications

  • Author

    Tae-Wan Koo ; Hee-Do Kang ; Jeunguk Ha ; Eunkwang Koh ; Jong-Gwan Yook

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Yonsei Univ., Seoul, South Korea
  • fYear
    2013
  • fDate
    5-9 Aug. 2013
  • Firstpage
    713
  • Lastpage
    717
  • Abstract
    In this paper, signal integrity (SI) of a mobile high-definition link (MHL) system is analyzed, having the discontinuous and asymmetric structures. In the SI analysis of the MHL system, three dimensional (3D) electromagnetic (EM) solver and time domain reflectometry (TDR) method are carried out. As a result, the differential signals with the discontinuous reference plane experience the degeneration of transmission characteristic due to the impedance mismatch, rendering by discontinuities in return current path of the signals. Moreover, it is found that the SI characteristic of the differential signal could be significantly degenerated, when the asymmetric guard traces with ground vias for electromagnetic interference (EMI) reduction are located closer to the signal trace than the balanced reference plane. Therefore, SI can be guaranteed with widely open eye diagram using the symmetric and continuous reference plane for the coupled signal lines in the high-speed digital interconnect.
  • Keywords
    electric impedance; high-speed techniques; interconnections; mobile radio; radio links; radiofrequency interference; radiowave propagation; signal processing; 3D EM solver; MHL system; SI analysis; TDR method; asymmetric guard traces; asymmetric structures; continuous reference plane; differential signals; discontinuous reference plane; discontinuous structures; high-speed digital interconnection; mobile applications; mobile high definition link system; signal integrity enhancement; symmetric reference plane; three dimensional electromagnetic solver; time domain reflectometry method; transmission characteristic; Electromagnetic interference; Impedance; Integrated circuit interconnections; Mobile communication; Silicon; Three-dimensional displays; Time-domain analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (EMC), 2013 IEEE International Symposium on
  • Conference_Location
    Denver, CO
  • ISSN
    2158-110X
  • Print_ISBN
    978-1-4799-0408-2
  • Type

    conf

  • DOI
    10.1109/ISEMC.2013.6670503
  • Filename
    6670503