DocumentCode :
646792
Title :
Prediction of radiated emission for complex systems under Realistic Operating Conditions
Author :
Hamann, David ; Battermann, Sven ; Mleczko, Marcin ; Garbe, Heyno
Author_Institution :
Inst. of Electr. Eng. & Meas. Technol., Leibniz Univ. Hannover, Hannover, Germany
fYear :
2013
fDate :
5-9 Aug. 2013
Firstpage :
757
Lastpage :
762
Abstract :
Today´s electronic devices are complex systems often consisting of different subsystems that tend to have radio frequency communication interfaces as well as interconnecting cables to auxiliary equipment required for electromagnetic compatibility testing. In many cases the subsystems are developed in different departments or even in different companies. This paper describes measurement techniques for such subsystems, including the possibility to establish radio frequency links to auxiliary equipment or other subsystems during the measurement of radiated emission. Based on transverse electromagnetic (TEM) waveguide measurements with the subsystems a prediction of the radiated emission of the complex system becomes possible before it´s prototype needs to be assembled. The analysis of the accumulated intermediate measurement data gives additional information for the optimization of the electromagnetic radiation of the system. An estimate for the directivity of each subsystem can be obtained.
Keywords :
electromagnetic compatibility; optimisation; TEM waveguide measurements; auxiliary equipment; complex systems; electromagnetic compatibility testing; electromagnetic radiation; electronic devices; interconnecting cables; optimization; radiated emission mesurement; radiated emission prediction; radio frequency communication interfaces; radio frequency links; subsystem directivity; transverse electromagnetic waveguide measurements; Antenna measurements; Antennas; Electromagnetic compatibility; Electromagnetic waveguides; Frequency measurement; Ports (Computers); Position measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility (EMC), 2013 IEEE International Symposium on
Conference_Location :
Denver, CO
ISSN :
2158-110X
Print_ISBN :
978-1-4799-0408-2
Type :
conf
DOI :
10.1109/ISEMC.2013.6670511
Filename :
6670511
Link To Document :
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