Title :
De-embedding techniques for transmission lines: An exploration, review, and proposal
Author :
Erickson, Nicholas ; Shringarpure, Ketan ; Fan, Jintao ; Achkir, Brice ; Siming Pan ; Chulsoon Hwang
Author_Institution :
EMC Lab., Missouri Univ. of Sci. & Technol.n, Rolla, MO, USA
Abstract :
In this paper, two transmission line based de-embedding techniques are reviewed for application in 3D IC measurements. In particular, full-wave models of extremely small stripline geometries are investigated. The advantages and drawbacks of each method are discussed in reference to simulation results, and a new hybrid method is proposed.
Keywords :
integrated circuit measurement; strip line circuits; transmission lines; 3D IC measurement; deembedding technique; full-wave model; stripline geometry; transmission line; Admittance; Impedance; Matrix converters; Power transmission lines; Stripline; Transmission line matrix methods; Transmission line measurements;
Conference_Titel :
Electromagnetic Compatibility (EMC), 2013 IEEE International Symposium on
Conference_Location :
Denver, CO
Print_ISBN :
978-1-4799-0408-2
DOI :
10.1109/ISEMC.2013.6670527
