DocumentCode :
64786
Title :
An Adaptive Pulse-Triggered Flip-Flop for a High-Speed and Voltage-Scalable Standard Cell Library
Author :
Shien-Chun Luo ; Ching-Ji Huang ; Yuan-Hua Chu
Author_Institution :
Ind. Technol. Res. Inst., Hsinchu, Taiwan
Volume :
60
Issue :
10
fYear :
2013
fDate :
Oct. 2013
Firstpage :
677
Lastpage :
681
Abstract :
Pulse-triggered flip-flops are candidates to improve pipeline speed, although flip-flop robustness and system timing closure are challenging in a wide range of supply voltages. Pulse-triggered flip-flops usually have specific structures and transistor sizes to optimize performance. The topology, transistor size, and threshold voltage of the flip-flop make the timing characteristics sensitive to the supply voltage. The transparent windows generated and required in a pulse-triggered flip-flop may have mismatch under supply voltage scaling, which is likely to result in functional and system timing failures. Therefore, this brief proposes an adaptive pulse-generating method to fit the transparent window required in situ. Process variations and intrinsic transistor driving-strength mismatches are considered. The proposed structure improves the robustness of pulse-triggered flip-flops and promises this high-speed clocked element for wide-voltage-range operations. A normalized timing metric is also introduced to characterize flip-flops and help timing tradeoffs in wide-voltage-range operations.
Keywords :
flip-flops; pulse circuits; transistor circuits; adaptive pulse-triggered flip-flop; high-speed standard cell library; intrinsic transistor; pipeline speed; process variations; supply voltage scaling; transistor sizes; voltage-scalable standard cell library; Computer architecture; Delays; Microprocessors; Robustness; Transistors; Voltage control; Dynamic voltage scaling (DVS); flip-flop; process variation; standard cell; subthreshold circuit;
fLanguage :
English
Journal_Title :
Circuits and Systems II: Express Briefs, IEEE Transactions on
Publisher :
ieee
ISSN :
1549-7747
Type :
jour
DOI :
10.1109/TCSII.2013.2273844
Filename :
6572831
Link To Document :
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