DocumentCode
647874
Title
A multi-criteria integrated probabilistic voltage vulnerability assessment method
Author
Yuzhang Lin ; Libao Shi ; Zhou Jian ; Liangzhong Yao ; Xiaofeng Lin ; Masoud, Bazargan
Author_Institution
Nat. Key Lab. of Power Syst. in Shenzhen, Tsinghua Univ., Shenzhen, China
fYear
2013
fDate
21-25 July 2013
Firstpage
1
Lastpage
5
Abstract
Conventional voltage vulnerability assessment methods and indices as well as weak area identification are one-sided and inconsistent with each other. Specially most of solutions are deterministic without considering the uncertainties in nature. Based on Super-Efficiency Data Envelopment Analysis (SEDEA) model, a multi-criteria integrated probabilistic voltage vulnerability assessment method is proposed in this paper. Three voltage vulnerability indices are selected for the assessment. Two integrated indices obtained by SEDEA model, Mean Voltage Vulnerability Index (MVVI) and Deviation Voltage Vulnerability Index (DVVI), are used to indicate the mean and deviation degree of bus voltage vulnerability respectively. By performing numerical simulations on IEEE standard test system, it can be concluded that the proposed method and indices are able to identify weak load buses comprehensively, effectively and objectively with random factors taken into account.
Keywords
IEEE standards; data envelopment analysis; power system control; voltage regulators; IEEE standard test system; bus voltage vulnerability; multicriteria integrated probabilistic; super-efficiency data envelopment analysis; voltage vulnerability assessment method; Analytical models; Digital video broadcasting; Europe; Data Envelopment Analysis; Monte Carlo Simulation; Voltage Stability; Vulnerability Assessment; Weak Bus;
fLanguage
English
Publisher
ieee
Conference_Titel
Power and Energy Society General Meeting (PES), 2013 IEEE
Conference_Location
Vancouver, BC
ISSN
1944-9925
Type
conf
DOI
10.1109/PESMG.2013.6672422
Filename
6672422
Link To Document