High-level test program generation strategies for processors

This paper brings together reliability and testability and introduces certain rules for generating high level test macros for processors. These rules help to generate higher quality test macros. On the other hand, these rules can be a reference guide for a programmer to write more reliable codes. The basic idea of these rules comes from the motto that a more testable code results in a lower reliability and vice versa. The empirical results show the effect of these rules in generating high quality high-level test macros and use of which results in a less reliable overall code. The programmer can use these guidelines for generating of less efficient testable code, and better reliable programs.