DocumentCode :
648527
Title :
Simulation features of diffusion doping process by means of software package of synopsys company
Author :
Lagunovich, N.L. ; Borzdov, V.M. ; Turtsevich, A.S.
Author_Institution :
Openly Join-Stock Co. INTEGRAL, Minsk, Belarus
fYear :
2013
fDate :
27-30 Sept. 2013
Firstpage :
1
Lastpage :
3
Abstract :
Two methods of diffusion doping process simulation are proposed. There were performed simulations of phosphor diffusion doping into p-type silicon substrates with the resistivity of ρv = 10 Ohm·cm and with the resistivity of ρv = 0.01 Ohm·cm using two methods of simulation. There were defined that results received by two different programme methods of diffusion description are almost equal.
Keywords :
elemental semiconductors; materials science computing; phosphors; semiconductor doping; silicon; software packages; Si; Synopsys company; diffusion description programme methods; diffusion doping process simulation method; p-type silicon substrates; phosphor diffusion doping; resistivity; software package;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design & Test Symposium, 2013 East-West
Conference_Location :
Rostov-on-Don
Print_ISBN :
978-1-4799-2095-2
Type :
conf
DOI :
10.1109/EWDTS.2013.6673112
Filename :
6673112
Link To Document :
بازگشت