Title :
Fault-injection testing: FIT-ability, optimal procedure and tool for FPGA-based systems SIL certification
Author :
Kharchenko, V. ; Sklyar, Volodymyr ; Odarushchenko, Oleg ; Ivasuyk, A.
Author_Institution :
Nat. Aerosp. Univ. named after N.E. Zhukovsky “KhAI”, Kharkiv, Ukraine
Abstract :
Challenges related to verification and validation (VV) of FPGA-based safety critical I&C systems (FICS) are analyzed. One of the mandatory techniques applied in process of VV and certification to requirements of IEC 61508 according with safety integrity level (SIL) is the fault insertion or injection testing (FIT). Specific features of FICS SIL-certification and FIT are described. Concept of FIT-ability, some theoretical issues and algorithm of the optimal FIT procedure taking into account different points and means of fault injection are suggested. The developed technique and tool VTP has been applied to verify modules of FPGA-based platform RadICS during SIL-certification.
Keywords :
IEC standards; certification; computerised instrumentation; electrical safety; fault diagnosis; field programmable gate arrays; formal verification; safety-critical software; FICS; FIT; FPGA-based safety critical I&C system; FPGA-based system SIL certification; IEC 61508; RadICS; SIL certification; VTP; VV technique; fault injection testing; safety integrity level; verification and validation;
Conference_Titel :
Design & Test Symposium, 2013 East-West
Conference_Location :
Rostov-on-Don
Print_ISBN :
978-1-4799-2095-2
DOI :
10.1109/EWDTS.2013.6673129
