DocumentCode
648565
Title
Properties of code with summation for logical circuit test organization
Author
Blyudov, Anton ; Efanov, Dmitry ; Sapozhnikov, Vladimir ; Sapozhnikov, Vladimir
Author_Institution
“Autom. & Remote Control on Railways” Dept., Petersburg State Transp. Univ., St. Petersburg, Russia
fYear
2013
fDate
27-30 Sept. 2013
Firstpage
1
Lastpage
4
Abstract
In this paper we consider binary codes with summation used at designing test systems of combinational logical circuits. We offer new codes, determine their properties and compare these codes with each other.
Keywords
binary codes; combinational circuits; integrated circuit design; binary codes; combinational circuits; logical circuit test organization; summation; test systems design;
fLanguage
English
Publisher
ieee
Conference_Titel
Design & Test Symposium, 2013 East-West
Conference_Location
Rostov-on-Don
Print_ISBN
978-1-4799-2095-2
Type
conf
DOI
10.1109/EWDTS.2013.6673150
Filename
6673150
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