DocumentCode :
648590
Title :
Simulation methods of diffusion alloying process by means of taurus TSUPREM-4 programme
Author :
Lagunovich, N.L. ; Borzdov, V.M.
Author_Institution :
Openly Join-Stock Co. INTEGRAL, Minsk, Belarus
fYear :
2013
fDate :
27-30 Sept. 2013
Firstpage :
1
Lastpage :
2
Abstract :
Two methods of diffusion alloying process simulation are proposed. There were performed simulations of phosphor diffusion alloying into p-type silicon substrates with the resistivity of ρv = 10 Ohm·cm and with the resistivity of ρv = 0.01 Ohm·cm using two methods of simulation. There were defined that results received by two different programme methods of diffusion description are almost equal.
Keywords :
alloying; diffusion; electrical resistivity; elemental semiconductors; phosphors; semiconductor process modelling; silicon; Si; Taurus TSUPREM-4 Programme; p-type silicon substrates; phosphor diffusion alloying; resistivity; simulation methods;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design & Test Symposium, 2013 East-West
Conference_Location :
Rostov-on-Don
Print_ISBN :
978-1-4799-2095-2
Type :
conf
DOI :
10.1109/EWDTS.2013.6673175
Filename :
6673175
Link To Document :
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