Application of defect injection flow for fault validation in memories

In the paper, an advanced flow for defect injection in the memories and its application for fault validation are presented. Specifically, the results of injecting address decoder and process variation defects are illustrated. The defect injection flow gives a possibility to inject different types of defects (such as resistive opens, resistive shorts, process variation defects, etc.) in different blocks of the memory layout (memory array, address decoder, sense amplifier, etc.) and then verify if a given test algorithm detects the injected defect.