Title :
A new structure for interconnect offline testing
Author :
Sadeghi-Kohan, Somayeh ; Keshavarz, Shahrzad ; Zokaee, Farzaneh ; Farahmandi, Farimah ; Navabi, Zainalabedin
Author_Institution :
Sch. of Electr. & Comput. Eng., Univ. of Tehran, Tehran, Iran
Abstract :
Multigigahertz range of working frequency, shrinking of technology and loss of signal integrity put circuits´ interconnection at a higher risk of permanent or more frequent transient faults. These faults reduce overall reliability and performance of the circuit. Because of this, testing interconnects becomes an important issue. This paper presents an offline interconnect testing method that improves test time compared to some other earlier methods. The proposed method is implemented by a simple hardware structure, which has low hardware overhead and can detect crosstalk and other types of interconnect faults.
Keywords :
integrated circuit interconnections; integrated circuit reliability; integrated circuit testing; circuit interconnection; circuit performance; circuit reliability; crosstalk detection; frequent transient faults; hardware structure; interconnect faults; interconnect offline testing; multigigahertz range; signal integrity;
Conference_Titel :
Design & Test Symposium, 2013 East-West
Conference_Location :
Rostov-on-Don
Print_ISBN :
978-1-4799-2095-2
DOI :
10.1109/EWDTS.2013.6673207