Title :
Analog layer extensions for analog/mixed-signal assertion languages
Author :
Ulus, Dogan ; Sen, Arunabha ; Baskaya, Faik
Author_Institution :
Dept. of Elecrical & Electron. Eng., Bogazici Univ., Istanbul, Turkey
Abstract :
Assertion-based methodology is gaining popularity in analog and mixed-signal (AMS) verification. Early AMS assertion languages are built on digital assertion languages. This results in limited native support to express most low-level aspects of AMS properties. We present three analog layer extensions to increase analog expressiveness in AMS assertion languages. We first describe the concept of haloes, an implicit way to handle tolerance values of analog signals in assertions. Then, booleanization of analog signals using dual-threshold is introduced to solve problems caused by fluctuations on signals. Finally, we integrate analog measurement operators into assertions. We validate our extensions using our prototype tool on a 10-bit two-stage pipelined analog-to-digital converter design.
Keywords :
electronic engineering computing; formal verification; mixed analogue-digital integrated circuits; AMS assertion language; analog layer extension; analog measurement operator; analog signal booleanization; analog-and-mixed-signal verification; analog-signal assertion language; digital assertion language; dual-threshold; mixed-signal assertion language; pipelined analog-to-digital converter design;
Conference_Titel :
Very Large Scale Integration (VLSI-SoC), 2013 IFIP/IEEE 21st International Conference on
Conference_Location :
Istanbul
DOI :
10.1109/VLSI-SoC.2013.6673252