• DocumentCode
    648667
  • Title

    A debugging method for gate level circuit designs by introducing programmability

  • Author

    Oshima, K. ; Matsumoto, Tad ; Fujita, Masayuki

  • Author_Institution
    Dept. of Electr. Eng. & Inf. Syst., Univ. of Tokyo, Tokyo, Japan
  • fYear
    2013
  • fDate
    7-9 Oct. 2013
  • Firstpage
    78
  • Lastpage
    83
  • Abstract
    As the verification and debugging of complicated VLSI designs are dominating the chip development time, automated debugging becomes more and more important. In this paper, we propose a method to correct buggy gate-level designs by introducing programmable circuits, such as look up table (LUT) and multiplexer (MUX), that are inserted in order to formulate the debugging processes mathematically. We first replace sets of gates with programmable circuits and try to find a configuration for correction. Some bugs, however, cannot be fixed with only the replacement. In such cases, we add another input to a LUT, where the selection of such additional input is a key for effective debugging. We introduce a necessary condition by which many unusable signals as input to the LUTs can be efficiently eliminated. The experimental results on industrial designs having real bugs show that our proposed method can automatically correct the designs.
  • Keywords
    VLSI; integrated circuit design; logic circuits; logic gates; multiplexing equipment; programmable circuits; table lookup; LUT; MUX; VLSI design; buggy gate-level circuit design; debugging method; logic circuit; logic gate; look up table; multiplexer; programmability; programmable circuit; design debugging; gate-level circuit; pro-grammable circuit;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Very Large Scale Integration (VLSI-SoC), 2013 IFIP/IEEE 21st International Conference on
  • Conference_Location
    Istanbul
  • Type

    conf

  • DOI
    10.1109/VLSI-SoC.2013.6673254
  • Filename
    6673254