• DocumentCode
    648695
  • Title

    Examining Thread Vulnerability analysis using fault-injection

  • Author

    Oz, Isil ; Topcuoglu, Haluk Rahmi ; Kandemir, Mahmut ; Tosun, O.

  • Author_Institution
    Comput. Eng. Dept., Bogazici Univ., Istanbul, Turkey
  • fYear
    2013
  • fDate
    7-9 Oct. 2013
  • Firstpage
    240
  • Lastpage
    245
  • Abstract
    With the scale down of transistor sizes and higher frequencies with low power modes in modern architectures, the chip components become more susceptible to transient errors. Concurrently, multicore machines are replacing traditional single-core machines in most application domains. Thread Vulnerability Factor (TVF) is a metric to evaluate relative soft error vulnerability of multithreaded applications running on multicore architectures. It makes possible vulnerability analysis of parallel programs by providing comparisons between them. In this work, we design a simulation-based fault-injection framework to evaluate soft error vulnerability of parallel applications and perform a validation study to evaluate parallel program vulnerability. The results of the simulation-based fault injection framework is compared with the results based on TVF analysis. Our results demonstrate that TVF provides an efficient vulnerability analysis by having the same ordering and similar vulnerability rates with fault-injection results for a set of multithreaded applications.
  • Keywords
    fault diagnosis; multi-threading; multiprocessing systems; parallel programming; TVF analysis; chip components; low power modes; multicore architectures; multicore machines; multithreaded applications; parallel program vulnerability; relative soft error vulnerability evaluation; simulation-based fault-injection framework; single-core machines; thread vulnerability factor analysis; transient errors; transistor sizes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Very Large Scale Integration (VLSI-SoC), 2013 IFIP/IEEE 21st International Conference on
  • Conference_Location
    Istanbul
  • Type

    conf

  • DOI
    10.1109/VLSI-SoC.2013.6673282
  • Filename
    6673282