• DocumentCode
    649070
  • Title

    Error-resilient systems via statistical signal processing

  • Author

    Abdallah, Rami A. ; Shanbhag, Naresh R.

  • Author_Institution
    Visual & Parallel Comput. Group, Intel Corp., Hillsboro, OR, USA
  • fYear
    2013
  • fDate
    16-18 Oct. 2013
  • Firstpage
    312
  • Lastpage
    317
  • Abstract
    This paper provides an overview of error-resilient techniques to design robust and energy-efficient nanoscale DSP systems while focusing on statistical error compensation techniques. We demonstrate that logic-level error resiliency devises techniques independent of the application context. This results in significant complexity overhead especially with the highly unreliable circuits fabric. On the other hand, system-level error resiliency, such as statistical error compensation, employs techniques from statistical signal processing in order to exploit the hardware error behavior at application level and engineer the error compensation mechanism to match the application requirements. The benefits of such a design philosophy are tremendous gains in robustness (> 1000x) and energy efficiency (3×-to-6×) In addition, the paper paves the way to the deployment of novel statistical error compensation techniques based on principles from pattern recognition and iterative/turbo detection.
  • Keywords
    error analysis; iterative methods; signal processing; statistical analysis; error-resilient systems; hardware error behavior; logic-level error resiliency; nanoscale DSP systems; pattern recognition; statistical error compensation; statistical signal processing; system-level error resiliency; Error resiliency; low power; statistical error compensation; voltage overscaling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Signal Processing Systems (SiPS), 2013 IEEE Workshop on
  • Conference_Location
    Taipei City
  • ISSN
    2162-3562
  • Type

    conf

  • DOI
    10.1109/SiPS.2013.6674525
  • Filename
    6674525