• DocumentCode
    649076
  • Title

    Error resilient MRF message passing architecture for stereo matching

  • Author

    Jungwook Choi ; Kim, Eric P. ; Rutenbar, Rob ; Shanbhag, Naresh R.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
  • fYear
    2013
  • fDate
    16-18 Oct. 2013
  • Firstpage
    348
  • Lastpage
    353
  • Abstract
    Message passing based inference algorithms have immense importance in real-world applications. In this paper, error resilience of a message passing based Markov random field (MRF) stereo matching architecture is explored and enhanced through application of algorithmic noise tolerance (ANT) in order to cope with nanometer imperfections in post-silicon devices. We first explore the inherent robustness of iteration based MRF inference algorithms. Analysis and simulations show that for a 20-bit architecture, small errors (e ≤ 1024) are tolerable, while large errors (e ≥ 4096) degrade the performance significantly. Based on these error characteristics, we propose an ANT architecture to effectively compensate for large magnitude circuit errors. Introducing timing errors via voltage over scaling (VQS), experimental results show that the proposed ANT based hardware can tolerate an error rate of 21.3 %, with performance degradation of only 0.47% at a gate complexity overhead of 44.7%, compared to an errorfree full precision hardware with an energy savings of 41 %.
  • Keywords
    Markov processes; error compensation; image matching; inference mechanisms; iterative methods; message passing; random processes; stereo image processing; ANT architecture; Markov random field; VQS; algorithmic noise tolerance; energy savings; error characteristics; error resilient MRF message passing architecture; gate complexity overhead; iteration based MRF inference algorithm; large magnitude circuit error compensation; message passing based MRF stereo matching architecture; message passing based inference algorithm; nanometer imperfection; performance degradation; post-silicon devices; timing error; voltage over scaling; word length 20 bit; Error resilience; Markov random field; algorithmic noise tolerance; message passing; stereo matching;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Signal Processing Systems (SiPS), 2013 IEEE Workshop on
  • Conference_Location
    Taipei City
  • ISSN
    2162-3562
  • Type

    conf

  • DOI
    10.1109/SiPS.2013.6674531
  • Filename
    6674531