• DocumentCode
    649163
  • Title

    A Winner-Take-All circuit with improved accuracy and tolerance to mismatch and process variations

  • Author

    Sundararajan, Gopalakrishnan ; Winstead, Chris

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Utah State Univ., Logan, UT, USA
  • fYear
    2013
  • fDate
    4-7 Aug. 2013
  • Firstpage
    265
  • Lastpage
    268
  • Abstract
    Winner-Take- All (WTA) circuit chooses a winner input from a set of input signals. WTA circuits employ transistors that operate in the sub-threshold or weak inversion region. With technology scaling, sub-threshold circuits are prone to mismatch and process variations which degrade the performance of these circuits. This paper presents a novel WTA circuit that employs a CMOS double pair transistor as a translinear element that is more tolerant to mismatch and process variations. Monte Carlo simulations are used to compare the performance of the existing and the proposed topologies to estimate the effects of process and mismatch variations. Results show that the proposed circuit is able to reduce the range of variations by three orders of magnitude compared to original one for similar variations in the transistor parameters. The proposed element also shows better accuracy in replicating the maximum input current compared to the original circuit.
  • Keywords
    CMOS analogue integrated circuits; MOSFET; Monte Carlo methods; CMOS double pair transistor; Monte Carlo simulations; WTA circuit; mismatch; process variations; sub-threshold region; technology scaling; translinear element; weak inversion region; winner-take-all circuit; Analog; Min-Max; Translinear; WTA;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (MWSCAS), 2013 IEEE 56th International Midwest Symposium on
  • Conference_Location
    Columbus, OH
  • ISSN
    1548-3746
  • Type

    conf

  • DOI
    10.1109/MWSCAS.2013.6674636
  • Filename
    6674636